Low Power SRAM using an Optimal Number of Split Bit Lines and Single-Ended Sensing

Low Power SRAM using an Optimal Number of Split Bit Lines and Single-Ended Sensing
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سي و يكمين كنفرانس بين المللي مهندسي برق
31st International Conference on Electrical Engineering (ICEE 2023)

doi
Article type
Conference
https://people.iut.ac.ir/en/sayedi/content/1640697