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Dr. Hossein Saidi
Professor, Department of Electrical and Computer Engineering,
en
Low-power dual-edge triggered state-retention scan flip-flop
Low-power dual-edge triggered state-retention scan flip-flop
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doi
#
2010-09
Article type
Journal
Dr. Hossein Saidi
https://people.iut.ac.ir/en/hsaidi/content/1629777
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